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How do you test CMOS devices for radiation-induced soft errors?

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Radiation-induced soft errors (RISEs) are transient faults that occur in CMOS devices when energetic particles strike the sensitive regions of the transistors, causing unwanted changes in logic states or currents. RISEs can affect the performance, reliability, and security of CMOS devices, especially in harsh environments like space, aviation, or nuclear facilities. In this article, you will learn how to test CMOS devices for RISEs using different methods and tools.

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